Below are some examples of our 3D Analysis capabilities. A 3D analysis is an element of dimensional inspection and is typically performed by superimposing 3D scan data with the 3D solid model that defines the geometry or part shape. This scan data can either be low density such as that obtained by a CMM or high density such as that obtained through non-contact 3D scanning. There is virtually no limit to the different ways that 3D analyses can be depicted. These include actual-to-nominal surface deviation characterized by color variation that corresponds to a numerical +/- material condition, 2D sectional profile analyses, and complete dimensional inspection of conventional drawing dimensions and tolerances.
Interested in 3D Analysis?
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Thu, 03/02/2017 - 14:21 — hannahl
March 2017: Did you know that Q-PLUS Labs has significant CT Scanning capabilities, specifically tailored to your application? For dimensional inspection, testing, or reverse engineering, our lab has the expertise to accurately measure large or small sized parts and assemblies. We provide high quality CT Scanning data, post processed into the information or results that you need (such as inspection reports or 3D CAD models). We are experienced in tackling projects with parts or assemblies containing many internal features, even those where nondestructive inspection is mandatory in order to gain access for conventional measurement or for other uses such as imaging and failure analysis. Click here to request a quote.
Wed, 02/08/2017 - 00:47 — hannahl
February 2017: Join Q-PLUS Labs at the 2017 MD&M West show at the Anaheim Convention Center in Anaheim, CA - February 7-9. Our booth has moved! Find us upstairs in the Precision Tec area. We will be unveiling a never before seen, cutting-edge, mystery measuring machine! We will also have the industry's leading measurement manufacturers featuring state of the art systems, software, and live demonstrations. Click here for Free Admission
Tue, 01/17/2017 - 16:44 — hannahl
January 2017: Q-PLUS Labs expands its extensive nano measurement capabilities with the introduction of a new laser confocal microscope for non-contact measurement. Using supremely high accuracy laser scanning, this system is extremely versatile and able to perform color profilometry as well as precise measurements down to .5 nanometers (500 picometers)! The system's speed of data acquisition has an incredibly fast response time and can characterize surfaces for accurate measurement results with high-resolution and low noise on a variety of objects, even almost to the "equator" on difficult to measure spherical shapes! Click here to request a quote.
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