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Surface Finish Analysis

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Q-PLUS offers advanced surface finish analysis and surface mapping and metrology capabilities 
including graphical depictions, numerous sensor configurations, many algorithm and post-processing options, and even the raw surface finish data. All surface finish measurements comply with ASME-B46.1.

How we acquire surface finish data:

  • Skidded 2D Contact Profilometry
    This type of measurement process involves a gage with a sensitive stylus contained within a probe attached to the metal rest pad, or skid that rests on the object being analyzed. The stylus and skid move together to measure the average roughness of the part's surface.

  • Skidless 2D & 3D Contact Profilometry
    Skidless surface finish analysis is a contact measurement method of acquiring finish data with a stylus. Because the skidless gages use an internal precision reference surface, these gages can measure form and waviness in addition to roughness on a micro-inch level.

  • Noncontact 2D & 3D Optical Profilometry
    This profilometry is a non-contact method which accommodates many sample geometries via chromatic confocal technology which uses white light to collect measurement data. However, whereas interferometry uses the superposition of waves after they are reflected off the object, chromatic confocal sensors measure the wavelength as it hits the surface of the object.

  • Nano Scanning

    Nano Scanning involves 3D scanning at the sub-micron level and is accomplished with a chromatic confocal sensor. This type of scanning can be used to measure or digitize very small geometry and can also acquire surface roughness data.

Recent News

Join Q-PLUS at Design-2-Part 2017

November 2017: Join Q-PLUS Labs at Design-2-Part 2017 in booth #306 at the San Diego Convention Center in San Diego, CA - November 15th-16th. This is the region's largest contract manufacturing tradeshow. Come see our selection of metrology equipment, and discuss your specific needs for measurement products & services with our application engineers & staff. There's also a chance to win $500 in Q-PLUS Bucks! Click here for FREE admission.


Design-2-Part 2017 Registration

Q-PLUS LABS 3D SCANNING CAPABILITIES EXPAND WITH REVOLUTIONARY AUTOMATED AND HIGHLY ACCURATE STRUCTURED LIGHT SCANNING

October 2017: Q-PLUS Labs introduces a fully automated 3D scanning solution that uses the latest cutting-edge technology in both robotics and structured light 3D scanning systems. Combining both speed and accuracy, automated 3D scanning can help accelerate the processes of manufacturing and production by improving the time it would usually take if using more traditional methods of obtaining measurement data. CMMs have long held favorability for automated inspection due to ease of programming, however they typically offer only single point by point sparse measurement data with contact probing on the part's surface. Comparatively, structured light scanning has made tremendous progress that now closely approaches the accuracies of CMMs, but captures millions of measurement points in seconds and without any contact to the part. Whether you are looking to outsource your inspection or integrate a new system within your current in-house quality process, Q-PLUS Labs offers automated 3D scanning services and products using the latest developments in robotic scanning to not only reduce the cost for inspection, but also speed up your production process. Click here to request more information.


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Join Q-PLUS at WESTEC 2017

September 2017: Join Q-PLUS Labs at WESTEC 2017 in booth #2319 at the Los Angeles Convention Center in Los Angeles, CA - September 12th-14th. Come see our selection of metrology equipment, and discuss your specific needs for measurement products & services with our application engineers & staff. There's also a chance to win $500 in Q-PLUS Bucks! Click here for FREE admission (a $50 value).


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