Q-PLUS offers advanced surface finish analysis and surface mapping and metrology capabilities
including graphical depictions, numerous sensor configurations, many algorithm and post-processing options, and even the raw surface finish data. All surface finish measurements comply with ASME-B46.1.
How we acquire surface finish data:
Skidded 2D Contact Profilometry
This type of measurement process involves a gage with a sensitive stylus contained within a probe attached to the metal rest pad, or skid that rests on the object being analyzed. The stylus and skid move together to measure the average roughness of the part's surface.
Skidless 2D & 3D Contact Profilometry
Skidless surface finish analysis is a contact measurement method of acquiring finish data with a stylus. Because the skidless gages use an internal precision reference surface, these gages can measure form and waviness in addition to roughness on a micro-inch level.
Noncontact 2D & 3D Optical Profilometry
This profilometry is a non-contact method which accommodates many sample geometries via chromatic confocal technology which uses white light to collect measurement data. However, whereas interferometry uses the superposition of waves after they are reflected off the object, chromatic confocal sensors measure the wavelength as it hits the surface of the object.
Nano Scanning involves 3D scanning at the sub-micron level and is accomplished with a chromatic confocal sensor. This type of scanning can be used to measure or digitize very small geometry and can also acquire surface roughness data.
Tue, 04/04/2017 - 16:05 — hannahl
April 2017: Join Q-PLUS Labs in Booth #312 as we exhibit in the 2017 Measurement Science Conference at the Disneyland Hotel in Anaheim, CA - April 6-7. Come see our selection of metrology equipment. We'll have application engineers & staff on hand to discuss your specific needs for measurement products & services. Exhibit Hall registration is free. Please see the show's pricing for all other events. Click here to register.
Thu, 03/02/2017 - 14:21 — hannahl
March 2017: Did you know that Q-PLUS Labs has significant CT Scanning capabilities, specifically tailored to your application? For dimensional inspection, testing, or reverse engineering, our lab has the expertise to accurately measure large or small sized parts and assemblies. We provide high quality CT Scanning data, post processed into the information or results that you need (such as inspection reports or 3D CAD models). We are experienced in tackling projects with parts or assemblies containing many internal features, even those where nondestructive inspection is mandatory in order to gain access for conventional measurement or for other uses such as imaging and failure analysis. Click here to request a quote.
Wed, 02/08/2017 - 00:47 — hannahl
February 2017: Join Q-PLUS Labs at the 2017 MD&M West show at the Anaheim Convention Center in Anaheim, CA - February 7-9. Our booth has moved! Find us upstairs in the Precision Tec area. We will be unveiling a never before seen, cutting-edge, mystery measuring machine! We will also have the industry's leading measurement manufacturers featuring state of the art systems, software, and live demonstrations. Click here for Free Admission
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